Please use this identifier to cite or link to this item: http://hdl.handle.net/2122/6752
AuthorsPolacci, M.* 
Mancini, L.* 
Baker, D. R.* 
TitleThe contribution of synchrotron X-ray computed microtomography to understanding volcanic processes
Issue DateMar-2010
Series/Report no.2/17(2010)
DOI10.1107/S0909049509048225
URIhttp://hdl.handle.net/2122/6752
Keywordshigh-resolution three-dimensional imaging
X-ray computed microtomography
volcanic eruptions
volcanic rock textures
Subject Classification04. Solid Earth::04.08. Volcanology::04.08.05. Volcanic rocks 
04. Solid Earth::04.08. Volcanology::04.08.07. Instruments and techniques 
AbstractA series of computed microtomography experiments are reported which were performed by using a third-generation synchrotron radiation source on volcanic rocks from various active hazardous volcanoes in Italy and other volcanic areas in the world. The applied technique allowed the internal structure of the investigated material to be accurately imaged at the micrometre scale and three-dimensional views of the investigated samples to be produced as well as three-dimensional quantitative measurements of textural features. The geometry of the vesicle (gas-filled void) network in volcanic products of both basaltic and trachytic compositions were particularly focused on, as vesicle textures are directly linked to the dynamics of volcano degassing. This investigation provided novel insights into modes of gas exsolution, transport and loss in magmas that were not recognized in previous studies using solely conventional two-dimensional imaging techniques. The results of this study are important to understanding the behaviour of volcanoes and can be combined with other geosciences disciplines to forecast their future activity.
Appears in Collections:Papers Published / Papers in press

Files in This Item:
File Description SizeFormat 
JSR_Polacci_etal_2010.pdf1.11 MBAdobe PDFView/Open
Show full item record

Page view(s)

53
Last Week
0
Last month
0
checked on Aug 17, 2017

Download(s)

21
checked on Aug 17, 2017

Google ScholarTM

Check

Altmetric